Guillermo Sapiro, Ph.D..Professor.Faculty.Electrical and Computer Engineering.guillermo.sapiro@duke.edu.+1 919 660 5252(tel)

Guillermo Sapiro, Ph.D.

James B. Duke Professor, Duke University

SFARI Investigator Website

Guillermo Sapiro received his B.Sc. (summa cum laude), M.Sc. and Ph.D. from the Department of Electrical Engineering at the Technion, Israel Institute of Technology, in 1989, 1991, and 1993 respectively. After postdoctoral research at the Massachusetts Institute of Technology, Sapiro became a member of technical staff at the research facilities of HP Labs in Palo Alto, California. He then joined the Department of Electrical and Computer Engineering at the University of Minnesota, where he held the position of Distinguished McKnight University Professor and Vincentine Hermes-Luh Chair in Electrical and Computer Engineering.

Sapiro is currently the James B. Duke Professor at Duke University. He works on theory and applications in computer vision, computer graphics, medical imaging, image analysis and machine learning. He has authored and co-authored over 450 papers in these areas.

He was awarded the Gutwirth Scholarship for Special Excellence in Graduate Studies in 1991, the Ollendorff Fellowship for Excellence in Vision and Image Understanding Work in 1992, the Rothschild Fellowship for Post-Doctoral Studies in 1993, the Office of Naval Research Young Investigator Award in 1998, the Presidential Early Career Awards for Scientist and Engineers (PECASE) in 1998, the National Science Foundation Career Award in 1999 and the National Security Science and Engineering Faculty Fellowship in 2010. He received the ‘Test of Time Award’ at the International Conference on Computer Vision in 2011 and the International Conference on Machine Learning in 2019.

He was elected to the American Academy of Arts and Sciences in 2018. He is also a fellow of the Institute of Electrical and Electronics Engineers (IEEE) and the Society for Industrial and Applied Mathematics (SIAM) and was the founding editor-in-chief of the SIAM Journal on Imaging Sciences.

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